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  • Integrated System & ApplicationHome >> Products >> Spectroscopy >> Integrated System & Application

    Product Name:Detector Responsivity Measurement System

    Model: DSR100 Series

    Supplier: Zolix

      
    Detector Responsivity Measurement System

    Photodetector is the sensor that could convert the optical radiation signal to the electrical signal, which is made from photoemission material. Most of the photodetectors have strong spectral selectivity in a certain Spectrum area. Therefore, for one photodetector, different wavelengths have different spectral responsivity. The spectral responsivity is an important parameter index for characterizing the photodetector performance.
    And for the photoelectric material researching , the effect of some characteristics of the material itself such as doping density, lattice imperfection, absorption coefficient and minority carrier diffusion length on the photoelectric response capacity and the quantum efficiency could be obtained by measuring and analyzing the spectral responsivity data. That is very important and helpful for choosing better material and processing improvement.


    DSR100 Detector Responsivity Measurement System

    Application
     
    ■ DUV detector
    ■ Solar cell detector
    ■ Optical fiber sensor
    ■ IR photoelectric sensor


    System Specifications

    ModelDSR100-X150A-ADSR100-T75SiN40-A
    Wavelength Range200~2500nm350~14­m
    Light sourceUV enhanced Xenon light sourceTungsten-halogen lamp and siliconnitride light source
    Repeatability*1200~450 nm≤ 2%-
    450~1800nm≤ 1%≤ 1%
    1.8~2.5 ­m≤ 2.5%≤ 1%
    2~6 ­m-≤ 3%
    6~14 ­m-≤ 5%
    OpticalUV enhancedSilvering
    Spot≤Φ1 mm≤Φ1 mm
    *1. Repeatability data is provided when the peak wavelength signal intensity is closing to the saturation value of the detector, and there are different standard detectors to cover the different wavelength range.

    Standard Reference Detector Accessories

    ModelWavelength RangeCalibrated by
    DSR-A1200~1100 nmNational Institute of Metrology, China
    DSR-A7300~1100 nmNational Institute of Metrology, China
    DSR-T1350~1000 nmNIST-traceable
    DSR-T2800~1800 nmNIST-traceable
    DSR-A2800~2500 nmXi 'an Institute of Applied Optics, China
    DSR-A81~14 ­mXi 'an Institute of Applied Optics, China

    System Size

    Sample Test

    Si Detector
    Wavelength range: 200-2500nm
    Wavelength spacing: 10nm
    Bias voltage: 1V
    Chopper frequency: 330 Hz


    System Benefits

    ◆Wide wavelength range (200~14000 nm, optional), widely applicable
    ◆Turnkey system, Easy maintenance.
    The system uses substitution method of measuring principle, which is designed into Turnkey mode. Users do not need to debug the system before experiments. Routine maintenance is also very simple.
    ◆CCD monitoring optical path for sample location. The detectors with very small area can be located precisely by the system.
    ◆perfect reflection optical design, optimization of spot quality
    the perfect reflection optical system, you can get the quality parallel spot or much small convergency spot.


    ◆High stability light source, reducing the background noise.

    ◆Data export format supports third- party software.
    DSR100 can save all original data, and the experimenter can save the data as the *.txt, *. *.xls* and so on. 

    Spectro-Radiometer for Light Source Characterisation   Spectro Radiometer Absorption -Reflection Spectrophotometer


                                                                                                                                                         

                       

     

                   

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